Close Potential of full pattern fit methods for the texture analysis of geological materials: implications from texture measurements at the recently upgraded neutron time of flight diffractometer SKAT,
Keppler, R., K. Ullemeyer, J. H. Behrman, M. Stipp (2014),
Journal of Applied Crystallography, 47 p. 1520–1534,
10.1107/S1600576714015830.